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ISQED
2003
IEEE
147views Hardware» more  ISQED 2003»
14 years 3 months ago
On Structural vs. Functional Testing for Delay Faults
A structurally testable delay fault might become untestable in the functional mode of the circuit due to logic or timing constraints or both. Experimental data suggests that there...
Angela Krstic, Jing-Jia Liou, Kwang-Ting Cheng, Li...
ISQED
2003
IEEE
102views Hardware» more  ISQED 2003»
14 years 3 months ago
Modeling Crosstalk Induced Delay
The amplitude of coupled noise is often used in estimating the crosstalk effect. Coupling noise-induced delay measures the impact of crosstalk on circuit performance. Efficient c...
Chung-Kuan Tsai, Malgorzata Marek-Sadowska
EUROGP
2003
Springer
101views Optimization» more  EUROGP 2003»
14 years 3 months ago
An Enhanced Framework for Microprocessor Test-Program Generation
Test programs are fragment of code, but, unlike ordinary application programs, they are not intended to solve a problem, nor to calculate a function. Instead, they are supposed to ...
Fulvio Corno, Giovanni Squillero
GECCO
2003
Springer
14 years 3 months ago
Problem-Independent Schema Synthesis for Genetic Algorithms
Abstract. As a preprocessing for genetic algorithms, static reordering helps genetic algorithms effectively create and preserve high-quality schemata, and consequently improves th...
Yong-Hyuk Kim, Yung-Keun Kwon, Byung Ro Moon
ICCSA
2003
Springer
14 years 3 months ago
Computational Modelling of Particle Degradation in Dilute Phase Pneumatic Conveyors
The aim of this paper is to develop a mathematical model with the ability to predict particle degradation during dilute phase pneumatic conveying. A numerical procedure, based on a...
Pierre Chapelle, Nicholas Christakis, Hadi Abou-Ch...