1333 search results - page 83 / 267 » Categorial Minimalism |
DAC
2008
ACM
14 years 11 months ago
2008
ACM
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
DAC
2008
ACM
14 years 11 months ago
2008
ACM
: Spin-Torque Transfer Magnetic RAM (STT MRAM) is a promising candidate for future universal memory. It combines the desirable attributes of current memory technologies such as SRA...
DAC
2008
ACM
14 years 11 months ago
2008
ACM
Achieving high performance under a peak temperature limit is a first-order concern for VLSI designers. This paper presents a new model of a thermally-managed system, where a stoch...
DAC
2008
ACM
14 years 11 months ago
2008
ACM
Temperature hot-spots have been known to cause severe reliability problems and to significantly increase leakage power. The register file has been previously shown to exhibit the ...
DAC
2007
ACM
14 years 11 months ago
2007
ACM
The test time for core-external interconnect shorts/opens is typically much less than that for core-internal logic. Therefore, prior work on test infrastructure design for core-ba...