81 search results - page 10 / 17 » Challenging the Mean Time to Failure: Measuring Dependabilit... |
DSD
2008
IEEE
14 years 2 months ago
2008
IEEE
While shrinking geometries of embedded LSI devices is beneficial for portable intelligent systems, it is increasingly susceptible to influences from electrical noise, process vari...
DSN
2005
IEEE
14 years 1 months ago
2005
IEEE
Device scaling and large scale integration have led to growing concerns about soft errors in microprocessors. To date, in all but the most demanding applications, implementing par...
ICWS
2010
IEEE
13 years 9 months ago
2010
IEEE
Several activities in service oriented computing can benefit from the knowledge of properties of a given service composition ahead of time. We will focus here on properties related...
IPM
2007
13 years 7 months ago
2007
In this article, we elaborate on the meaning of quality in digital libraries (DLs) by proposing a model that is deeply grounded in a formal framework for digital libraries: 5S (St...
ATAL
2005
Springer
14 years 1 months ago
2005
Springer
We describe a very large scale distributed robotic system, involving a team of over 100 robots, that has been successfully deployed in large, unknown indoor environments, over ext...