High Speed Serializer Deserializers (serdes) are traditionally tested using functional BIST. This paper presents an improved BIST for testing the digital part of a serdes using ci...
LVDS is the acronym for Low-Voltage-DifferentialSignaling and is described in both the ANSI/TIA/EIA644 and IEEE 1596.3 standards. High performance yet Low Power and EMI have made ...