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ITC
1997
IEEE
94views Hardware» more  ITC 1997»
14 years 3 months ago
Identification of Defective CMOS Devices Using Correlation and Regression Analysis of Frequency Domain Transient Signal Data
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points and on IDD switching transients on the sup...
James F. Plusquellic, Donald M. Chiarulli, Steven ...
ICPR
2008
IEEE
14 years 5 months ago
Boosting performance for 2D Linear Discriminant Analysis via regression
Two Dimensional Linear Discriminant Analysis (2DLDA) has received much interest in recent years. However, 2DLDA could make pairwise distances between any two classes become signi...
Nam Nguyen, Wanquan Liu, Svetha Venkatesh
INTERSPEECH
2010
13 years 5 months ago
Integration of multilayer regression analysis with structure-based pronunciation assessment
Automatic pronunciation assessment has several difficulties. Adequacy in controlling the vocal organs is often estimated from the spectral envelopes of input utterances but the en...
Masayuki Suzuki, Yu Qiao, Nobuaki Minematsu, Keiki...
TIP
2008
128views more  TIP 2008»
13 years 10 months ago
The Pairing of a Wavelet Basis With a Mildly Redundant Analysis via Subband Regression
A distinction is usually made between wavelet bases and wavelet frames. The former are associated with a one-to-one representation of signals, which is somewhat constrained but mos...
Michael Unser, Dimitri Van De Ville
ESSMAC
2003
Springer
14 years 4 months ago
Analysis of Some Methods for Reduced Rank Gaussian Process Regression
Abstract. While there is strong motivation for using Gaussian Processes (GPs) due to their excellent performance in regression and classification problems, their computational com...
Joaquin Quiñonero Candela, Carl Edward Rasm...