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» Combining Instance Generation and Resolution
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TCAD
2010
102views more  TCAD 2010»
13 years 4 months ago
Functional Test Generation Using Efficient Property Clustering and Learning Techniques
Abstract--Functional verification is one of the major bottlenecks in system-on-chip design due to the combined effects of increasing complexity and lack of automated techniques for...
Mingsong Chen, Prabhat Mishra
EVOW
2007
Springer
14 years 3 months ago
Generation of Tree Decompositions by Iterated Local Search
Many instances of NP-hard problems can be solved efficiently if the treewidth of their corresponding graph is small. Finding the optimal tree decompositions is an NP-hard problem a...
Nysret Musliu
ICIP
2004
IEEE
14 years 11 months ago
Defect detection on hardwood logs using high resolution three dimensional laser scan data
The location, type, and severity of external defects on hardwood logs and stems are the primary indicators of overall log quality and value. External defects provide hints about t...
Liya Thomas, Lamine Mili, Clifford A. Shaffer, Ed ...
SIGGRAPH
1998
ACM
14 years 1 months ago
Interactive Multi-Resolution Modeling on Arbitrary Meshes
During the last years the concept of multi-resolution modeling has gained special attention in many fields of computer graphics and geometric modeling. In this paper we generaliz...
Leif Kobbelt, Swen Campagna, Jens Vorsatz, Hans-Pe...
EVOW
2008
Springer
13 years 11 months ago
A Hybrid Column Generation Approach for the Berth Allocation Problem
Abstract. The Berth Allocation Problem (BAP) consists on programming and allocating ships to berthing areas along a quay. The BAP is modeled as a vehicle routing problem and a rece...
Geraldo R. Mauri, Alexandre C. M. Oliveira, Luiz A...