442 search results - page 6 / 89 » Combining test case generation for component and integration... |
ICCD
2004
IEEE
14 years 6 months ago
2004
IEEE
— We propose an automatic test pattern generation (ATPG) framework for combinational threshold networks. The motivation behind this work lies in the fact that many emerging nanot...
SEFM
2003
IEEE
14 years 3 months ago
2003
IEEE
The Specification and Description Language (SDL) together with its associated tool sets can be used for the generation of Tree and Tabular Combined Notation (TTCN) test cases. Sur...
SNPD
2003
13 years 11 months ago
2003
We present our experience in automatically deriving a detailed test case plan exclusively using the UML diagrams developed during the analysis and design phases. We consider in pa...
SOQUA
2004
13 years 11 months ago
2004
We present an approach for the use case and scenario-based testing of software components. Use cases and scenarios are applied to describe the functional requirements of a software...
APSEC
2005
IEEE
14 years 3 months ago
2005
IEEE
We describe the “STSC” prototype tool that supports the statistical testing of software components. The tool supports a wide range of operational profiles and test oracles for...