: We present a new, dynamic algorithm for test sequence compaction and test cycle reduction for combinationaland sequential circuits. Several dynamic algorithms for compaction in c...
We consider the problem of representing sets of 3D points in the context of 3D reconstruction from point matches. We present a new representation for sets of 3D points, which is g...
Excessive switching activity during scan testing can cause average power dissipation and peak power during test to be much higher than during normal operation. This can cause prob...
Ranganathan Sankaralingam, Rama Rao Oruganti, Nur ...
As users get connected with new-generation smart programmable phones and Personal Digital Assistants, they look for geographic information and location-aware services. In such a s...
Abstract. We propose a very general syntactical notion of epistemic state and a compact axiomatization for iterated revision when the new information is an epistemic state. We set ...