229 search results - page 14 / 46 » Compaction Schemes with Minimum Test Application Time |
CASES
2010
ACM
13 years 6 months ago
2010
ACM
Unobtrusive capturing of program execution traces in real-time is crucial in debugging cyber-physical systems. However, tracing even limited program segments is often cost-prohibi...
AAAI
2007
13 years 10 months ago
2007
In recent years, the size of combinatorial applications and the need to produce high-quality solutions quickly have increased steadily, providing significant challenges for optim...
TVLSI
2008
13 years 8 months ago
2008
We present a selective encoding method that reduces test data volume and test application time for scan testing of Intellectual Property (IP) cores. This method encodes the slices ...
VTS
2002
IEEE
14 years 28 days ago
2002
IEEE
Parallel test application helps reduce the otherwise considerable test times in SOCs; yet its applicability is limited by average and peak power considerations. The typical test v...
FOCS
2009
IEEE
14 years 2 months ago
2009
IEEE
— We show that for every fixed k, there is a linear time algorithm that decides whether or not a given graph has a vertex set X of order at most k such that G − X is planar (w...