138 search results - page 12 / 28 » Compaction-based test generation using state and fault infor... |
ICST
2010
IEEE
13 years 6 months ago
2010
IEEE
—When a program is modified during software evolution, developers typically run the new version of the program against its existing test suite to validate that the changes made ...
SAC
2008
ACM
13 years 7 months ago
2008
ACM
Software-based self-test (SBST) is emerging as a promising technology for enabling at-speed testing of high-speed embedded processors testing in an SoC system. For SBST, test rout...
JSS
2008
13 years 6 months ago
2008
This report presents a model-driven, stress test methodology aimed at increasing chances of discovering faults related to network traffic in Distributed Real-Time Systems (DRTS). T...
ICFP
2006
ACM
14 years 7 months ago
2006
ACM
A transient hardware fault occurs when an energetic particle strikes a transistor, causing it to change state. These faults do not cause permanent damage, but may result in incorr...
COMPSAC
1996
IEEE
13 years 11 months ago
1996
IEEE
This paper discusses how conventional testing criteria such as branch coverage can be applied for the testing of member functions inside a class. To support such testing technique...