2 search results - page 1 / 1 » Compensation of Scanner Creep and Hysteresis for AFM Nanoman... |
128
Voted
TASE
2008
IEEE
15 years 5 months ago
2008
IEEE
113
click to vote
ICRA
2007
IEEE
15 years 11 months ago
2007
IEEE
Abstract—Automation has long been recognized as an important goal in AFM (Atomic Force Microscope) nanomanipulation research. For the precise manipulation of small particles with...