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Compensation of Scanner Creep and Hysteresis for AFM Nanoman...
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TASE
2008
IEEE
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Software Engineering
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Compensation of Scanner Creep and Hysteresis for AFM Nanomanipulation
13 years 8 months ago
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Babak Mokaberi, Aristides A. G. Requicha
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ICRA
2007
IEEE
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Robotics
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Automated Nanomanipulation with Atomic Force Microscopes
14 years 2 months ago
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Abstract—Automation has long been recognized as an important goal in AFM (Atomic Force Microscope) nanomanipulation research. For the precise manipulation of small particles with...
Babak Mokaberi, Jaehong Yun, Michael Wang, Aristid...
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