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KDD
2000
ACM
211views Data Mining» more  KDD 2000»
14 years 1 months ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
VLDB
2000
ACM
129views Database» more  VLDB 2000»
14 years 1 months ago
Offering a Precision-Performance Tradeoff for Aggregation Queries over Replicated Data
Strict consistency of replicated data is infeasible or not required by many distributed applications, so current systems often permit stale replication, in which cached copies of ...
Chris Olston, Jennifer Widom
ISLPED
1995
ACM
131views Hardware» more  ISLPED 1995»
14 years 1 months ago
Guarded evaluation: pushing power management to logic synthesis/design
The need to reduce the power consumption of the next generation of digital systems is clearly recognized. At the system level, power management is a very powerful technique and de...
Vivek Tiwari, Sharad Malik, Pranav Ashar
KI
1995
Springer
14 years 1 months ago
Integrating Vision and Language: Towards Automatic Description of Human Movements
The integration of vision and natural languageprocessingincreasingly attracts attention in different areas of AI research. Up to now, however, there have only been a few attempts a...
Gerd Herzog, Karl Rohr
AAAI
2007
14 years 13 days ago
Hybrid Inference for Sensor Network Localization Using a Mobile Robot
In this paper, we consider a hybrid solution to the sensor network position inference problem, which combines a real-time filtering system with information from a more expensive,...
Dimitri Marinakis, David Meger, Ioannis M. Rekleit...
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