11 search results - page 1 / 3 » Concurrent Error Detection in Linear Analog Circuits Using S... |
ITC
2003
IEEE
14 years 24 days ago
2003
IEEE
We present a novel methodology for concurrent error detection in linear analog circuits. We develop a rigorous theory that yields an error detection circuit of size that is, in ge...
DAC
1998
ACM
13 years 11 months ago
1998
ACM
This papers describes a new, fast and economical methodology to test linear analog circuits based on adaptive algorithms. To the authors knowledge, this is the first time such tec...
ISCAS
2002
IEEE
14 years 13 days ago
2002
IEEE
A variation of the differential steepest descent algorithm, here called the dithered linear search (DLS), is examined and applied to analog filter adaptation. The DLS algorithm is...
CDC
2009
IEEE
13 years 10 months ago
2009
IEEE
— In this paper, a new method to design an observer for nonlinear systems described by Takagi-Sugeno (TS) model, with unmeasurable premise variables, is proposed. Most of existin...
SPIN
2004
Springer
14 years 26 days ago
2004
Springer
Most approaches for model checking software are based on ration of abstract models from source code, which may greatly reduce the search space, but may also introduce errors that a...