62 search results - page 6 / 13 » Concurrent Fault Detection in Random Combinational Logic |
TVLSI
2002
13 years 6 months ago
2002
Circular built-in self-test (BIST) is a "test per clock" scheme that offers many advantages compared with conventional BIST approaches in terms of low area overhead, simp...
CORR
2010
Springer
13 years 1 months ago
2010
Springer
Combinational or Classical logic circuits dissipate heat for every bit of information that is lost. Information is lost when the input vector cannot be recovered from its correspon...
ISPDC
2008
IEEE
14 years 1 months ago
2008
IEEE
Self-stabilizing token circulation algorithms are not always adapted for dynamic networks. Random walks are well known to play a crucial role in the design of randomized algorithm...
FDTC
2010
Springer
13 years 4 months ago
2010
Springer
Fault injections constitute a major threat to the security of embedded systems. The errors in the cryptographic algorithms have been shown to be extremely dangerous, since powerful...
VLSID
1993
IEEE
13 years 10 months ago
1993
IEEE
This paper discusses a Genetic Algorithm-based method of generating test vectorsfor detecting faults in combinational circuits. The GA-based approach combines the merits of two te...