281 search results - page 12 / 57 » Concurrent Java Test Generation as a Search Problem |
KBSE
1998
IEEE
13 years 12 months ago
1998
IEEE
Structural testing criteria are mandated in many software development standards and guidelines. The process of generating test-data to achieve 100 coverage of a given structural c...
CEC
2005
IEEE
14 years 1 months ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
EOR
2007
2007
Solving the short-term electrical generation scheduling problem by an adaptive evolutionary approach
13 years 7 months ago
In this paper, we introduce an adaptive evolutionary approach to solve the short-term electrical generation scheduling problem (STEGS). The STEGS is a hard constraint satisfaction...
EPIA
2007
Springer
14 years 1 months ago
2007
Springer
Research in the field of examination timetabling has developed in two directions. The first looks at applying various methodologies to induce examination timetables. The second tak...
VLSID
1997
IEEE
13 years 12 months ago
1997
IEEE
The problem of test generation belongs to the class of NP-complete problems and it is becoming more and more di cult as the complexity of VLSI circuits increases, and as long as e...