4299 search results - page 17 / 860 » Concurrent Test Generation |
RV
2009
Springer
14 years 29 days ago
2009
Springer
TSE
2002
13 years 8 months ago
2002
COMPSAC
2002
IEEE
14 years 1 months ago
2002
IEEE
As web–based information systems usually run in concurrent environment, the complexity for implementing and testing those systems is significantly high. Therefore it is useful ...
CORR
2010
Springer
13 years 5 months ago
2010
Springer
In a previous work we introduced slice graphs as a way to specify both infinite languages of directed acyclic graphs (DAGs) and infinite languages of partial orders. Therein we fo...
ATS
2009
IEEE
14 years 3 months ago
2009
IEEE
High performance designs often use the on-chip device PLLs for accurate test clock generation during testing. The on-chip clock generator is designed in a programmable way to faci...