4299 search results - page 47 / 860 » Concurrent Test Generation |
SEFM
2003
IEEE
14 years 1 months ago
2003
IEEE
The Specification and Description Language (SDL) together with its associated tool sets can be used for the generation of Tree and Tabular Combined Notation (TTCN) test cases. Sur...
DAC
1995
ACM
14 years 2 days ago
1995
ACM
The paper describes the evolution of an Interdisciplinary Concurrent Design Methodology (ICDM) and the metrics used to compare four generations of wearable computer artifacts prod...
ICSE
2008
IEEE-ACM
14 years 8 months ago
2008
IEEE-ACM
As Graphical User Interfaces become more popular, the need for GUI testing tools becomes greater. However, many current test generation techniques require proprietary tools and ca...
MODELS
2007
Springer
14 years 2 months ago
2007
Springer
Abstract. In this paper, we deal with model-based automatic test generation. We show how to use UML state machines, UML class diagrams, and OCL expressions to automatically derive ...
ERLANG
2003
ACM
14 years 1 months ago
2003
ACM
We present an implemented technique for generating test cases from state machine specifications. The work is motivated by a need for testing of protocols and services developed b...