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VLSID
1993
IEEE
136views VLSI» more  VLSID 1993»
15 years 6 months ago
A Simulation-Based Test Generation Scheme Using Genetic Algorithms
This paper discusses a Genetic Algorithm-based method of generating test vectorsfor detecting faults in combinational circuits. The GA-based approach combines the merits of two te...
M. Srinivas, Lalit M. Patnaik
ICSE
2007
IEEE-ACM
16 years 2 months ago
Feedback-Directed Random Test Generation
We present a technique that improves random test generation by incorporating feedback obtained from executing test inputs as they are created. Our technique builds inputs incremen...
Carlos Pacheco, Shuvendu K. Lahiri, Michael D. Ern...
97
Voted
ICSE
2007
IEEE-ACM
16 years 2 months ago
Using GUI Run-Time State as Feedback to Generate Test Cases
This paper presents a new automated model-driven technique to generate test cases by using feedback from the execution of a "seed test suite" on an application under tes...
Xun Yuan, Atif M. Memon
ICSE
2009
IEEE-ACM
15 years 9 months ago
Guided path exploration for regression test generation
Regression test generation aims at generating a test suite that can detect behavioral differences between the original and the modified versions of a program. Regression test gen...
Kunal Taneja, Tao Xie, Nikolai Tillmann, Jonathan ...
134
Voted
KBSE
2009
IEEE
15 years 9 months ago
Reggae: Automated Test Generation for Programs Using Complex Regular Expressions
Abstract—Test coverage such as branch coverage is commonly measured to assess the sufficiency of test inputs. To reduce tedious manual efforts in generating high-covering test i...
Nuo Li, Tao Xie, Nikolai Tillmann, Jonathan de Hal...