Sciweavers

4299 search results - page 67 / 860
» Concurrent Test Generation
Sort
View
INLG
2010
Springer
15 years 12 days ago
Generating Natural Language Descriptions of Z Test Cases
Critical software most often requires an independent validation and verification (IVV). IVV is usually performed by domain experts, who are not familiar with specific, many times ...
Maximiliano Cristiá, Brian Plüss
KBSE
2010
IEEE
15 years 27 days ago
MODA: automated test generation for database applications via mock objects
Software testing has been commonly used in assuring the quality of database applications. It is often prohibitively expensive to manually write quality tests for complex database ...
Kunal Taneja, Yi Zhang, Tao Xie
KBSE
2007
IEEE
15 years 8 months ago
Directed test generation using symbolic grammars
We present CESE, a tool that combines exhaustive enumeration of test inputs from a structured domain with symbolic execution driven test generation. We target programs whose valid...
Rupak Majumdar, Ru-Gang Xu
ICSE
1999
IEEE-ACM
15 years 6 months ago
Using a Goal-Driven Approach to Generate Test Cases for GUIs
The widespread use of GUIs for interacting with software is leading to the construction of more and more complex GUIs. With the growing complexity comes challenges in testing the ...
Atif M. Memon, Martha E. Pollack, Mary Lou Soffa
132
Voted
VLSID
1997
IEEE
135views VLSI» more  VLSID 1997»
15 years 6 months ago
Parallel Genetic Algorithms for Simulation-Based Sequential Circuit Test Generation
The problem of test generation belongs to the class of NP-complete problems and it is becoming more and more di cult as the complexity of VLSI circuits increases, and as long as e...
Dilip Krishnaswamy, Michael S. Hsiao, Vikram Saxen...