4299 search results - page 762 / 860 » Concurrent Test Generation |
121
click to vote
ASYNC
2000
IEEE
15 years 7 months ago
2000
IEEE
Fault Abstraction and Collapsing Framework for Asynchronous Circuits Philip P. Shirvani, Subhasish Mitra Center for Reliable Computing Stanford University Stanford, CA Jo C. Eberge...
123
Voted
ROBOCUP
1999
Springer
15 years 6 months ago
1999
Springer
The underlying research topics and the architecture of the UBU team are briefly described. The aim of developing UBU is to subject a series of tools and procedures for agent decis...
141
Voted
ISSTA
2010
ACM
15 years 6 months ago
2010
ACM
In program debugging, finding a failing run is only the first step; what about correcting the fault? Can we automate the second task as well as the first? The AutoFix-E tool au...
152
Voted
CTRSA
2009
Springer
15 years 6 months ago
2009
Springer
In many applications, it is desirable to work with signatures that are both short, and yet where many messages from different signers be verified very quickly. RSA signatures sati...
226
Voted
DAS
2006
Springer
15 years 6 months ago
2006
Springer
Abstract. Automatic identification of a script in a given document image facilitates many important applications such as automatic archiving of multilingual documents, searching on...