4299 search results - page 8 / 860 » Concurrent Test Generation |
ET
2007
13 years 7 months ago
2007
Abstract In order to perform an on-chip test for characterizing both static and transmission parameters of embedded analog-to-digital converters (ADCs), this paper presents an osci...
FASE
2010
Springer
14 years 2 months ago
2010
Springer
Multithreaded concurrent programs often exhibit bugs due to unintended interferences among the concurrent threads. Such bugs are often hard to reproduce because they typically hap...
JLP
2006
13 years 7 months ago
2006
We present a formal framework for notions related to testing and model based test generation for a behavioural subset of UML Statecharts (UMLSCs). This framework builds, on one ha...
TPHOL
2009
IEEE
14 years 2 months ago
2009
IEEE
Abstract. FinFuns are total functions that are constant except for a finite set of points, i.e. a generalisation of finite maps. We formalise them in Isabelle/HOL and present how...
SEFM
2008
IEEE
14 years 1 months ago
2008
IEEE
The only practical way to test distributed messagepassing systems is to use local testing. In this approach, used in formalisms such as concurrent TTCN-3, some components are repl...