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115
Voted
ATS
2000
IEEE
15 years 7 months ago
2000
IEEE
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
173
Voted
JAVACARD
2000
15 years 6 months ago
2000
: Open-cards have introduced a new life cycle for smart card embedded applications. In the case of Java Card, they have raised the problem of embedded object-oriented applet valida...
127
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CORR
2010
Springer
15 years 2 months ago
2010
Springer
Testing is a vital part of the software development process. Test Case Generation (TCG) is the process of automatically generating a collection of test-cases which are applied to ...
143
Voted
SIGSOFT
2007
ACM
16 years 3 months ago
2007
ACM
With the growing complexity of web applications, identifying web interfaces that can be used for testing such applications has become increasingly challenging. Many techniques tha...
114
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ICST
2009
IEEE
15 years 9 months ago
2009
IEEE
We propose a novel testing approach that combines information from UML sequence models and state machine models. Current approaches that rely solely on sequence models do not cons...