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ICS
2000
Tsinghua U.
13 years 11 months ago
Compiling object-oriented data intensive applications
Processing and analyzing large volumes of data plays an increasingly important role in many domains of scienti c research. High-level language and compiler support for developing ...
Renato Ferreira, Gagan Agrawal, Joel H. Saltz
ICSE
2009
IEEE-ACM
14 years 2 months ago
WISE: Automated test generation for worst-case complexity
Program analysis and automated test generation have primarily been used to find correctness bugs. We present complexity testing, a novel automated test generation technique to ...
Jacob Burnim, Sudeep Juvekar, Koushik Sen
ISVC
2007
Springer
14 years 1 months ago
ChipViz : Visualizing Memory Chip Test Data
This paper presents a technique that allows test engineers to visually analyze and explore within memory chip test data. We represent the test results from a generation of chips al...
Amit P. Sawant, Ravi Raina, Christopher G. Healey
ACSAC
2007
IEEE
14 years 2 months ago
Improving Signature Testing through Dynamic Data Flow Analysis
The effectiveness and precision of network-based intrusion detection signatures can be evaluated either by direct analysis of the signatures (if they are available) or by using bl...
Christopher Kruegel, Davide Balzarotti, William K....
PAMI
2002
88views more  PAMI 2002»
13 years 7 months ago
A Frequency Domain Technique for Range Data Registration
This work introduces an original method for registering pairs of 3D views consisting of range data sets which operates in the frequency domain. The Fourier transform allows the dec...
Luca Lucchese, Gianfranco Doretto, Guido M. Cortel...