This paper examines the power of different nonrigid registration models to detect changes in TBM, and their stability when no real changes are present. Specifically, we investigat...
Igor Yanovsky, Paul M. Thompson, Stanley Osher, Xu...
This paper presents a low-overhead scheme for built-in self-test of circuits with scan. Complete (100%) fault coverage is obtained without modifying the function logic and without...
Abstract. The impact of clause and intraclausal coordination detection to dependency parsing of Slovene is examined. New methods based on machine learning and heuristic rules are p...
— Error correcting coding is the dominant technique to achieve acceptable soft-error rates in memory arrays. In many modern circuits, the number of memory elements in the random ...
Michael E. Imhof, Hans-Joachim Wunderlich, Christi...
Sequential test generators fail to yield tests for some stuck-at-faults because they are unable to reach certain states necessary for exciting propagating these target faults. Add...