1401 search results - page 74 / 281 » Cost-Sensitive Test Strategies |
ISESE
2003
IEEE
14 years 3 months ago
2003
IEEE
The two most common strategies for verification and validation, inspection and testing, are in a controlled experiment evaluated in terms of their fault detection capabilities. Th...
VTS
1996
IEEE
14 years 2 months ago
1996
IEEE
In this paper we investigate optimal voltage testing approaches for physically-based faults in CMOS circuits. We describe the general nature of the problem and then focus on two f...
CSEE
2006
Springer
14 years 2 days ago
2006
Springer
Test-driven development (TDD) is an agile software development strategy that addresses both design and testing. This paper describes a controlled experiment that examines the effe...
ERLANG
2008
ACM
13 years 12 months ago
2008
ACM
When creating software, data types are the basic bricks. Most of the time a programmer will use data types defined in library modules, therefore being tested by many users over ma...
VLSID
1997
IEEE
14 years 2 months ago
1997
IEEE
The problem of test generation belongs to the class of NP-complete problems and it is becoming more and more di cult as the complexity of VLSI circuits increases, and as long as e...