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» Coupling-based Integration Testing
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IS
2007
13 years 7 months ago
Security Attack Testing (SAT) - testing the security of information systems at design time
For the last few years a considerable number of efforts have been devoted into integrating security issues into information systems development practices. This has led to a number...
Haralambos Mouratidis, Paolo Giorgini
KDD
2000
ACM
211views Data Mining» more  KDD 2000»
13 years 11 months ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
JSA
2000
103views more  JSA 2000»
13 years 7 months ago
Testing and built-in self-test - A survey
As the density of VLSI circuits increases it becomes attractive to integrate dedicated test logic on a chip. This Built-in Self-Test (BIST) approach not only offers economic benef...
Andreas Steininger
AOSD
2008
ACM
13 years 9 months ago
AspectT: aspect-oriented test case instantiation
e instantiation is the transformation of abstract test cases cutable test scripts. Abstract test cases are either created during model based test case generation or are manually d...
Sebastian Benz
HICSS
2007
IEEE
125views Biometrics» more  HICSS 2007»
14 years 1 months ago
Reconciling Manual and Automated Testing: The AutoTest Experience
Software can be tested either manually or automatically. The two approaches are complementary: automated testing can perform a large number of tests in little time, whereas manual...
Andreas Leitner, Ilinca Ciupa, Bertrand Meyer, Mar...