For the last few years a considerable number of efforts have been devoted into integrating security issues into information systems development practices. This has led to a number...
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
As the density of VLSI circuits increases it becomes attractive to integrate dedicated test logic on a chip. This Built-in Self-Test (BIST) approach not only offers economic benef...
e instantiation is the transformation of abstract test cases cutable test scripts. Abstract test cases are either created during model based test case generation or are manually d...
Software can be tested either manually or automatically. The two approaches are complementary: automated testing can perform a large number of tests in little time, whereas manual...
Andreas Leitner, Ilinca Ciupa, Bertrand Meyer, Mar...