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ICCD
2004
IEEE
134views Hardware» more  ICCD 2004»
14 years 4 months ago
An Automatic Test Pattern Generation Framework for Combinational Threshold Logic Networks
— We propose an automatic test pattern generation (ATPG) framework for combinational threshold networks. The motivation behind this work lies in the fact that many emerging nanot...
Pallav Gupta, Rui Zhang, Niraj K. Jha
FASE
2007
Springer
14 years 1 months ago
Testing Scenario-Based Models
The play-in/play-out approach suggests a new paradigm for system development using scenario-based requirements. It allows the user to develop a high level scenario-based model of t...
Hillel Kugler, Michael J. Stern, E. Jane Albert Hu...
JAVACARD
2000
13 years 11 months ago
Automatic Test Generation for Java-Card Applets
: Open-cards have introduced a new life cycle for smart card embedded applications. In the case of Java Card, they have raised the problem of embedded object-oriented applet valida...
Hugues Martin, Lydie du Bousquet
SOCO
2009
Springer
14 years 2 months ago
A Framework for Testing Model Composition Engines
Model composition helps designers managing complexities by modeling different system views separately, and later compose them into an integrated model. In the past years, researche...
Freddy Munoz, Benoit Baudry
ISSTA
2006
ACM
14 years 1 months ago
APTE: automated pointcut testing for AspectJ programs
Aspect-Oriented Programming (AOP) has been proposed as a methodology that provides new modularization of software systems by allowing encapsulation of cross-cutting concerns. Aspe...
Prasanth Anbalagan, Tao Xie