243 search results - page 23 / 49 » Coverage-biased Random Exploration of Models |
ISPASS
2007
IEEE
14 years 1 months ago
2007
IEEE
Parameter variation due to manufacturing error will be an unavoidable consequence of technology scaling in future generations. The impact of random variation in physical factors s...
NIPS
2008
13 years 9 months ago
2008
We consider the problem of obtaining the approximate maximum a posteriori estimate of a discrete random field characterized by pairwise potentials that form a truncated convex mod...
AAAI
2008
13 years 10 months ago
2008
Previous studies have demonstrated that encoding a Bayesian network into a SAT-CNF formula and then performing weighted model counting using a backtracking search algorithm can be...
ICS
2010
Tsinghua U.
14 years 5 months ago
2010
Tsinghua U.
: We initiate the study of local, sublinear time algorithms for finding vertices with extreme topological properties -- such as high degree or clustering coefficient -- in large so...
SMI
2005
IEEE
14 years 1 months ago
2005
IEEE
Creating surfaces with intricate small-scale features (microgeometry) and detail is an important task in geometric modeling and computer graphics. We present a model processing me...