39 search results - page 3 / 8 » Defect Detection Efficiency: Test Case Based vs. Exploratory... |
DSD
2005
IEEE
14 years 1 months ago
2005
IEEE
1 This paper presents a method for power-constrained system-on-chip test scheduling in an abort-on-first-fail environment where the test is terminated as soon as a fault is detecte...
INFORMATICALT
2008
13 years 7 months ago
2008
This paper is concerned with the problem of image analysis based detection of local defects embedded in particleboard surfaces. Though simple, but efficient technique developed is ...
ICST
2010
IEEE
13 years 5 months ago
2010
IEEE
A Feature Model (FM) is a compact representation of all the products of a software product line. The automated extraction of information from FMs is a thriving research topic invo...
ICSM
2008
IEEE
14 years 1 months ago
2008
IEEE
In mission critical systems, such as those developed by NASA, it is very important that the test engineers properly recognize the severity of each issue they identify during testi...
DSD
2005
IEEE
14 years 1 months ago
2005
IEEE
We describe a new e-learning environment and a runtime platform for educational tools on digital system testing and design for testability. This environment is being developed in ...