41 search results - page 7 / 9 » Defect Tolerance in Multiple-FPGA Systems |
MIDDLEWARE
2009
Springer
14 years 4 months ago
2009
Springer
Abstract. Enterprise-system upgrades are unreliable and often produce downtime or data-loss. Errors in the upgrade procedure, such as broken dependencies, constitute the leading ca...
DAC
2005
ACM
14 years 10 months ago
2005
ACM
Device and interconnect fabrics at the nanoscale will have a density of defects and susceptibility to transient faults far exceeding those of current silicon technologies. In this...
PRDC
2008
IEEE
14 years 4 months ago
2008
IEEE
Reliability has become a serious concern as systems embrace nanometer technologies. In this paper, we propose a novel approach for organizing redundancy that provides high degree ...
TASE
2008
IEEE
13 years 9 months ago
2008
IEEE
Applications such as layered manufacturing, or in general, solid free-form fabrication, pose a major challenge on online process control. For these parts to be functional, it is i...
STORAGESS
2006
ACM
14 years 3 months ago
2006
ACM
Batch-correlated failures result from the manifestation of a common defect in most, if not all, disk drives belonging to the same production batch. They are much less frequent tha...