254 search results - page 15 / 51 » Deriving test plans from architectural descriptions |
ISLPED
1996
ACM
14 years 2 months ago
1996
ACM
We present an architectural power simulation technique for PLA-based controllers. The contributions of this work are (1) a simple but ecient power characterization of PLAs; and (2...
STAIRS
2008
13 years 11 months ago
2008
We study a problem of path planning for a group of robots in this paper. The problem is stated as a finding of spatial-temporal paths through which the robots can go from their ini...
ETS
2010
IEEE
13 years 11 months ago
2010
IEEE
Testing of 3D stacked ICs (SICs) is becoming increasingly important in the semiconductor industry. In this paper, we address the problem of test architecture optimization for 3D s...
PDIS
1996
IEEE
14 years 2 months ago
1996
IEEE
Users today are struggling to integrate a broad range of information sources providing di erent levels of query capabilities. Currently, data sources with di erent and limitedcapa...
DAC
1996
ACM
14 years 2 months ago
1996
ACM
The testability of basic DSP datapath structures using pseudorandom built-in self-test techniques is examined. The addition of variance mismatched signals is identified as a testi...