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CF
2007
ACM
2007
ACM
Adaptive VP decay: making value predictors leakage-efficient designs for high performance processors
13 years 11 months ago
Energy-efficient microprocessor designs are one of the major concerns in both high performance and embedded processor domains. Furthermore, as process technology advances toward d...
ISLPED
2006
ACM
14 years 1 months ago
2006
ACM
In a few technology generations, limitations of fabrication processes will make accurate design time power estimates a daunting challenge. Static leakage current which comprises a...
DATE
2010
IEEE
14 years 25 days ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
SOSP
2007
ACM
14 years 4 months ago
2007
ACM
Power management has become increasingly necessary in large-scale datacenters to address costs and limitations in cooling or power delivery. This paper explores how to integrate p...
ISLPED
2006
ACM
14 years 1 months ago
2006
ACM
Process variations will increasingly impact the operational characteristics of integrated circuits in nanoscale semiconductor technologies. Researchers have proposed various desig...