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ET
2002
122views more  ET 2002»
13 years 7 months ago
Using At-Speed BIST to Test LVDS Serializer/Deserializer Function
LVDS is the acronym for Low-Voltage-DifferentialSignaling and is described in both the ANSI/TIA/EIA644 and IEEE 1596.3 standards. High performance yet Low Power and EMI have made ...
Magnus Eckersand, Fredrik Franzon, Ken Filliter
TCAD
2008
183views more  TCAD 2008»
13 years 7 months ago
Systematic and Automated Multiprocessor System Design, Programming, and Implementation
Abstract--For modern embedded systems in the realm of highthroughput multimedia, imaging, and signal processing, the complexity of embedded applications has reached a point where t...
Hristo Nikolov, Todor Stefanov, Ed F. Deprettere
EMSOFT
2005
Springer
14 years 1 months ago
A unified HW/SW interface model to remove discontinuities between HW and SW design
One major challenge in System-on-Chip (SoC) design is the definition and design of interfaces between hardware and software. Traditional ASIC designer and software designer model ...
Aimen Bouchhima, Xi Chen, Frédéric P...
ICCAD
2006
IEEE
119views Hardware» more  ICCAD 2006»
14 years 4 months ago
Energy management for real-time embedded systems with reliability requirements
With the continued scaling of CMOS technologies and reduced design margins, the reliability concerns induced by transient faults have become prominent. Moreover, the popular energ...
Dakai Zhu, Hakan Aydin
EUC
2007
Springer
14 years 1 months ago
Assured-Timeliness Integrity Protocols for Distributable Real-Time Threads with in Dynamic Distributed Systems
Networked embedded systems present unique challenges for system designers composing distributed applications with dyanmic, real-time, and resilience requirements. We consider the ...
Binoy Ravindran, Edward Curley, Jonathan Stephen A...