18 search results - page 4 / 4 » Design of a Single Event Upset (SEU) Mitigation Technique fo... |
CF
2005
ACM
13 years 9 months ago
2005
ACM
As microarchitectural and system complexity grows, comprehending system behavior becomes increasingly difficult, and often requires obtaining and sifting through voluminous event ...
APCSAC
2004
IEEE
13 years 11 months ago
2004
IEEE
As device sizes continue shrinking, lower charges are needed to activate gates, and consequently ever smaller external events (such as single ionizing particles of naturally occurr...
FPGA
2009
ACM
14 years 2 months ago
2009
ACM
Aggressive scaling increases the number of devices we can integrate per square millimeter but makes it increasingly difficult to guarantee that each device fabricated has the inte...