2918 search results - page 515 / 584 » Design tools for reliability analysis |
ISPASS
2007
IEEE
14 years 4 months ago
2007
IEEE
Parameter variation due to manufacturing error will be an unavoidable consequence of technology scaling in future generations. The impact of random variation in physical factors s...
PLDI
2004
ACM
14 years 3 months ago
2004
ACM
In this paper we present Jedd, a language extension to Java that supports a convenient way of programming with Binary Decision Diagrams (BDDs). The Jedd language abstracts BDDs as...
CATA
2001
13 years 11 months ago
2001
: In this paper we analyze some existing tools and approaches to image data modeling and we propose an Object-Oriented Image Data (OOID) model. It can be applied on a wide variety ...
CORR
2010
Springer
13 years 5 months ago
2010
Springer
Random linear network codes can be designed and implemented in a distributed manner, with low computational complexity. However, these codes are classically implemented [1] over fi...
ICIP
1999
IEEE
14 years 11 months ago
1999
IEEE
An integral scheme that provides a global eigen approach to the problem of face recognition of still images has been presented in [1]. The scheme is based on the representation of...