124 search results - page 12 / 25 » Designing Reliable Digital Molecular Electronic Circuits |
ASYNC
2006
IEEE
14 years 1 months ago
2006
IEEE
Distributed sensor networks, human body implants, and hand-held electronics have tight energy budgets that necessitate low power circuits. Most of these devices include an analog-...
DAC
2009
ACM
14 years 8 months ago
2009
ACM
Efficient system-level design is increasingly relying on hierarchical design-space exploration, as well as compositional methods, to shorten time-to-market, leverage design re-use...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a significant reliability concern in present day digital circuit design. With continued scaling, th...
DAC
2005
ACM
13 years 9 months ago
2005
ACM
Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...
CF
2004
ACM
14 years 25 days ago
2004
ACM
This paper presents a fault tolerant design technique for the clockless wave pipeline. The specific architectural model investigated in this paper is the two-phase clockless asyn...