—As transistor feature sizes continue to shrink into the sub-90nm range and beyond, the effects of process variations on critical path delay and chip yields have amplified. A com...
Model compensation schemes are a powerful approach to handling mismatches between training and testing conditions. Normally these schemes are run in a batch adaptation mode, re-re...
We have previously proposed unsupervised cross-validation (CV) adaptation that introduces CV into an iterative unsupervised batch mode adaptation framework to suppress the influe...
Image segmentation is a crucial part of image processing applications. Currently available approaches require significant computer power to handle large images. We present an effi...
Human behavior and housing resist every standardization effort. Many aspects such as different technical equipment, furniture, and usage patterns make our surroundings as individu...
Torben Weis, Marcus Handte, Mirko Knoll, Christian...