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CORR
2010
Springer
104views Education» more  CORR 2010»
13 years 7 months ago
Heuristic approach to optimize the number of test cases for simple circuits
In this paper a new solution is proposed for testing simple stwo stage electronic circuits. It minimizes the number of tests to be performed to determine the genuinity of the circ...
S. M. Thamarai, K. Kuppusamy, T. Meyyappan
ICASSP
2011
IEEE
12 years 11 months ago
A combined linear programming-maximum likelihood approach to radial velocity data analysis for extrasolar planet detection
In this paper we introduce a new technique for estimating the parameters of the Keplerian model commonly used in radial velocity data analysis for extrasolar planet detection. The...
Prabhu Babu, Petre Stoica
ETS
2011
IEEE
212views Hardware» more  ETS 2011»
12 years 7 months ago
Structural Test for Graceful Degradation of NoC Switches
Abstract—Networks-on-Chip (NoCs) are implicitly fault tolerant due to their inherent redundancy. They can overcome defective cores, links and switches. As a side effect, yield is...
Atefe Dalirsani, Stefan Holst, Melanie Elm, Hans-J...
VLDB
2010
ACM
190views Database» more  VLDB 2010»
13 years 6 months ago
Continuous authentication on relational streams
According to the database outsourcing model, a data owner delegates database functionality to a thirdparty service provider, which answers queries received from clients. Authentic...
Stavros Papadopoulos, Yin Yang, Dimitris Papadias
BMCBI
2010
121views more  BMCBI 2010»
13 years 5 months ago
A grammar-based distance metric enables fast and accurate clustering of large sets of 16S sequences
Background: We propose a sequence clustering algorithm and compare the partition quality and execution time of the proposed algorithm with those of a popular existing algorithm. T...
David J. Russell, Samuel F. Way, Andrew K. Benson,...