Modern artifacts are typically composed of many system components and exhibit a complex pattern of continuous/discrete behaviors. A concurrent hybrid automaton is a powerful model...
In this paper, we propose a diagnostic test generation method in conjunction with an efficient sequential SAT-based diagnosis procedure to precisely identify multiple defective si...
This paper proposes a diagnosis architecture that integrates consistency based diagnosis with induced time series classifiers, trying to combine the advantages of both methods. Co...
This paper proposes a diagnosis scheme aimed at reducing diagnosis time of distributed small embedded SRAMs (e-SRAMs). This scheme improves the one proposed in [7, 8]. The improve...
The advantage to “one test at a time” fault diagnosis is its ability to implicate the components of complicated defect behaviors. The disadvantage is the large size and opacit...