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ISSRE
2008
IEEE
14 years 2 months ago
RUGRAT: Runtime Test Case Generation Using Dynamic Compilers
Ben Breech, Lori L. Pollock, John Cavazos
EUROMICRO
2005
IEEE
14 years 1 months ago
Improvement of Design Specifications with Inspection and Testing
Dietmar Winkler, Bernhard Riedl, Stefan Biffl
FATES
2005
Springer
14 years 1 months ago
Play to Test
Andreas Blass, Yuri Gurevich, Lev Nachmanson, Marg...