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ITCC
2005
IEEE
14 years 4 months ago
2005
IEEE
DAC
2007
ACM
14 years 12 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
ICMCS
2006
IEEE
14 years 4 months ago
2006
IEEE
With increased concern for physical security, video surveillance is becoming an important business area. Similar camera-based system can also be used in such diverse applications ...