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» Digital statistical analysis using VHDL
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CASES
2005
ACM
14 years 26 days ago
An Esterel processor with full preemption support and its worst case reaction time analysis
The concurrent synchronous language Esterel allows proto treat reactive systems in an abstract, concise manner. An Esterel program is typically first translated into other, non-s...
Xin Li, Jan Lukoschus, Marian Boldt, Michael Harde...
EGITALY
2006
14 years 8 days ago
SVG Vectorization by Statistical Region Merging
In this paper a novel algorithm for raster to vector conversion is presented. The technique is mainly devoted to vectorize digital picture maintaining an high degree of photoreali...
Sebastiano Battiato, Giovanni Maria Farinella, Gio...
CCGRID
2003
IEEE
14 years 4 months ago
Using grid technologies to face medical image analysis challenges
The availability of digital imagers inside hospitals and their ever growing inspection capabilities have established digital medical images as a key component of many pathologies ...
Johan Montagnat, Vincent Breton, Isabelle E. Magni...
CIVR
2003
Springer
198views Image Analysis» more  CIVR 2003»
14 years 4 months ago
Text or Pictures? An Eyetracking Study of How People View Digital Video Surrogates
bstract and display digital video surrogates. This study reports on an investigation of digital video results pages that use textual and visual surrogates. Twelve subjects selected...
Anthony Hughes, Todd Wilkens, Barbara M. Wildemuth...
ITC
1999
IEEE
89views Hardware» more  ITC 1999»
14 years 3 months ago
Defect detection using power supply transient signal analysis
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. The power supply transient signals of an ...
Amy Germida, Zheng Yan, James F. Plusquellic, Fide...