Particle filters (PF) and auxiliary particle filters (APF) are widely used sequential Monte Carlo (SMC) techniques. In this paper we comparatively analyse the Sampling Importanc...
Locally adaptive classifiers are usually superior to the use of a single global classifier. However, there are two major problems in designing locally adaptive classifiers. First,...
Juan Dai, Shuicheng Yan, Xiaoou Tang, James T. Kwo...
The supervised learning paradigm assumes in general that both training and test data are sampled from the same distribution. When this assumption is violated, we are in the setting...
Processing and extracting meaningful knowledge from count data is an important problem in data mining. The volume of data is increasing dramatically as the data is generated by da...
This paper is concerned with the e cient reconstruction of illumination from area luminaires. We outline a 2-pass scheme a lightpass, tracing ray bundles from the luminaires follow...