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576views
17 years 1 months ago
Within-die Process Variations: How Accurately can They Be Statistically Modeled?
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
Brendan Hargreaves, Henrik Hult, Sherief Reda
115
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MICAI
2007
Springer
15 years 8 months ago
A New Hybrid Summarizer Based on Vector Space Model, Statistical Physics and Linguistics
In this article we present a hybrid approach for automatic summarization of Spanish medical texts. There are a lot of systems for automatic summarization using statistics or lingui...
Iria da Cunha, Silvia Fernández, Patricia V...
108
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IPPS
2008
IEEE
15 years 8 months ago
Parallel performance wizard: A performance analysis tool for partitioned global-address-space programming
Given the complexity of parallel programs, developers often must rely on performance analysis tools to help them improve the performance of their code. While many tools support th...
Hung-Hsun Su, Max Billingsley, Alan D. George
111
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MICCAI
2005
Springer
16 years 3 months ago
Deformable Registration of Brain Tumor Images Via a Statistical Model of Tumor-Induced Deformation
An approach to the deformable registration of three-dimensional brain tumor images to a normal brain atlas is presented. The approach involves the integration of three components:...
Ashraf Mohamed, Dinggang Shen, Christos Davatzikos
ASPDAC
2006
ACM
230views Hardware» more  ASPDAC 2006»
15 years 8 months ago
Statistical Bellman-Ford algorithm with an application to retiming
— Process variations in digital circuits make sequential circuit timing validation an extremely challenging task. In this paper, a Statistical Bellman-Ford (SBF) algorithm is pro...
Mongkol Ekpanyapong, Thaisiri Watewai, Sung Kyu Li...