2659 search results - page 404 / 532 » Do we mean the same |
129
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GLVLSI
2007
IEEE
15 years 8 months ago
2007
IEEE
Reliability modeling and evaluation is expected to be one of the major issues in emerging nano-devices and beyond 22nm CMOS. Such devices would have inherent propensity for gate f...
135
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ATAL
2010
Springer
15 years 5 months ago
2010
Springer
In this paper, we study a service procurement problem with uncertainty as to whether service providers are capable of completing a given task within a specified deadline. This typ...
143
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LOBJET
2006
15 years 4 months ago
2006
ABSTRACT. Aspect-orientation promises better modularity than pure object-oriented decomposition. A typical benefit of increased modularity is ease of maintenance, evolution and reu...
142
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TCS
2008
15 years 4 months ago
2008
Mobile sensors can self-deploy in a purely decentralized and distributed fashion, so to reach in finite time a state of static equilibrium in which they cover uniformly the enviro...
138
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PROMISE
2010
14 years 11 months ago
2010
Background: Defects are related to failures and they do not have much power for indicating a higher quality or a better system above the baseline that the end-users expect. Nevert...