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VLSID
2008
IEEE
111views VLSI» more  VLSID 2008»
14 years 10 months ago
Power Reduction of Functional Units Considering Temperature and Process Variations
Continuous technology scaling has resulted in an increase in both, the power density as well as the variation in device dimensions (process variations) of the manufactured process...
Deepa Kannan, Aviral Shrivastava, Sarvesh Bhardwaj...
VLSID
2007
IEEE
209views VLSI» more  VLSID 2007»
14 years 10 months ago
Simultaneous Power Fluctuation and Average Power Minimization during Nano-CMOS Behavioral Synthesis
We present minimization methodologies and an algorithm for simultaneous scheduling, binding, and allocation for the reduction of total power and power fluctuation during behaviora...
Saraju P. Mohanty, Elias Kougianos
VLSID
2005
IEEE
224views VLSI» more  VLSID 2005»
14 years 10 months ago
Accurate Stacking Effect Macro-Modeling of Leakage Power in Sub-100nm Circuits
An accurate and efficient stacking effect macro-model for leakage power in sub-100nm circuits is presented in this paper. Leakage power, including subthreshold leakage power and ga...
Shengqi Yang, Wayne Wolf, Narayanan Vijaykrishnan,...
CHI
2002
ACM
14 years 10 months ago
Acquisition of expanding targets
There exist several user interface widgets that dynamically grow in size in response to the user's focus of attention. Some of these, such as icons in toolbars, expand to fac...
Michael J. McGuffin, Ravin Balakrishnan
RECOMB
2005
Springer
14 years 10 months ago
Alignment of Optical Maps
We introduce a new scoring method for calculation of alignments of optical maps. Missing cuts, false cuts, and sizing errors present in optical maps are addressed by our alignment...
Anton Valouev, Lei Li, Yu-Chi Liu, David C. Schwar...