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TCAD
2010
102views more  TCAD 2010»
13 years 2 months ago
Functional Test Generation Using Efficient Property Clustering and Learning Techniques
Abstract--Functional verification is one of the major bottlenecks in system-on-chip design due to the combined effects of increasing complexity and lack of automated techniques for...
Mingsong Chen, Prabhat Mishra
ETS
2011
IEEE
212views Hardware» more  ETS 2011»
12 years 7 months ago
Structural Test for Graceful Degradation of NoC Switches
Abstract—Networks-on-Chip (NoCs) are implicitly fault tolerant due to their inherent redundancy. They can overcome defective cores, links and switches. As a side effect, yield is...
Atefe Dalirsani, Stefan Holst, Melanie Elm, Hans-J...
ICSE
2009
IEEE-ACM
14 years 2 months ago
JUnitMX - A change-aware unit testing tool
Developers use unit testing to improve the quality of software systems. Current development tools for unit testing help to automate test execution, to report results, and to gener...
Jan Wloka, Barbara G. Ryder, Frank Tip
DFT
2005
IEEE
102views VLSI» more  DFT 2005»
13 years 9 months ago
Using Statistical Transformations to Improve Compression for Linear Decompressors
Linear decompressors are the dominant methodology used in commercial test data compression tools. However, they are generally not able to exploit correlations in the test data, an...
Samuel I. Ward, Chris Schattauer, Nur A. Touba
MMM
2012
Springer
294views Multimedia» more  MMM 2012»
12 years 2 months ago
Improving Cluster Selection and Event Modeling in Unsupervised Mining for Automatic Audiovisual Video Structuring
Abstract. Can we discover audio-visually consistent events from videos in a totally unsupervised manner? And, how to mine videos with different genres? In this paper we present our...
Anh-Phuong Ta, Mathieu Ben, Guillaume Gravier