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» Efficient Design Error Correction of Digital Circuits
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ISCAS
2006
IEEE
162views Hardware» more  ISCAS 2006»
14 years 2 months ago
Combined image signal processing for CMOS image sensors
This paper presents an efficient image signal processing structure for CMOS image sensors to achieve low area and power consumption. Although CMOS image sensors (CISs) have variou...
Kimo Kim, In-Cheol Park
GLVLSI
2006
IEEE
152views VLSI» more  GLVLSI 2006»
14 years 2 months ago
2 Gbps SerDes design based on IBM Cu-11 (130nm) standard cell technology
This paper introduces a standard cell based design for a Serializer and Deserializer (SerDes) communication link. The proposed design is area, power and design time efficient as c...
Rashed Zafar Bhatti, Monty Denneau, Jeff Draper
ICCAD
1996
IEEE
141views Hardware» more  ICCAD 1996»
14 years 27 days ago
An observability-based code coverage metric for functional simulation
Functional simulation is the most widely used method for design verification. At various levels of abstraction, e.g., behavioral, register-transfer level and gate level, the design...
Srinivas Devadas, Abhijit Ghosh, Kurt Keutzer
DATE
2010
IEEE
168views Hardware» more  DATE 2010»
14 years 1 months ago
A new placement algorithm for the mitigation of multiple cell upsets in SRAM-based FPGAs
Modern FPGAs have been designed with advanced integrated circuit techniques that allow high speed and low power performance, joined to reconfiguration capabilities. This makes new...
Luca Sterpone, Niccolò Battezzati
ICES
2000
Springer
140views Hardware» more  ICES 2000»
14 years 10 days ago
Evolving Cellular Automata for Self-Testing Hardware
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...