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VLSID
2007
IEEE
108views VLSI» more  VLSID 2007»
14 years 7 months ago
Soft Error Rate Analysis for Combinational Logic Using An Accurate Electrical Masking Model
Accurate electrical masking modeling represents a significant challenge in soft error rate analysis for combinational logic circuits. In this paper, we use table lookup MOSFET mode...
Feng Wang 0004, Yuan Xie, R. Rajaraman, Balaji Vai...
MICCAI
2003
Springer
14 years 8 months ago
Assessing Early Brain Development in Neonates by Segmentation of High-Resolution 3T MRI
Abstract. This paper describes effort towards automatic tissue segmentation in neonatal MRI. Extremely low contrast to noise ratio (CNR), regional intensity changes due to RF coil ...
Guido Gerig, Marcel Prastawa, Weili Lin, John H. G...
SIGSOFT
2007
ACM
14 years 8 months ago
Finding bugs efficiently with a SAT solver
We present an approach for checking code against rich specifications, based on existing work that consists of encoding the program in a relational logic and using a constraint sol...
Julian Dolby, Mandana Vaziri, Frank Tip
ASPDAC
2006
ACM
122views Hardware» more  ASPDAC 2006»
14 years 1 months ago
IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults
– We propose an interconnect diagnosis scheme based on Oscillation Ring test methodology for SOC design with heterogeneous cores. The target fault models are delay faults and cro...
Katherine Shu-Min Li, Yao-Wen Chang, Chauchin Su, ...
VLDB
1989
ACM
98views Database» more  VLDB 1989»
13 years 11 months ago
A Family of Incomplete Relational Database Models
In this paper. we utilize intervals for unknown values in incompleterelational databases.We usetablesto representunknown relations. First, we define three partial tuple types in a...
Adegbemiga Ola, Gultekin Özsoyoglu